Show simple item record

dc.contributor.authorPelletier, Robert V.en_US
dc.date.accessioned2013-03-19T19:37:34Z
dc.date.available2013-03-19T19:37:34Z
dc.date.issued1993en_US
dc.identifierocm00035423en_US
dc.identifier.urihttp://hdl.handle.net/1993/17771
dc.description.abstracten_US
dc.format.extentxi, 112 leaves :en_US
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleAlternative approaches in improving fault tolerance for a wafer scale environmenten_US
dc.typemaster thesisen_US
dc.degree.disciplineElectrical and Computer Engineeringen_US
dc.degree.levelMaster of Science (M.Sc.)en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record