Alternative approaches in improving fault tolerance for a wafer scale environment
| dc.contributor.author | Pelletier, Robert V. | en_US |
| dc.date.accessioned | 2013-03-19T19:37:34Z | |
| dc.date.available | 2013-03-19T19:37:34Z | |
| dc.date.issued | 1993 | en_US |
| dc.identifier | ocm00035423 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1993/17771 | |
| dc.description.abstract | en_US | |
| dc.format.extent | xi, 112 leaves : | en_US |
| dc.language.iso | eng | en_US |
| dc.rights | open access | en_US |
| dc.title | Alternative approaches in improving fault tolerance for a wafer scale environment | en_US |
| dc.type | master thesis | en_US |
| dc.degree.discipline | Electrical and Computer Engineering | en_US |
| dc.degree.level | Master of Science (M.Sc.) | en_US |
