Alternative approaches in improving fault tolerance for a wafer scale environment

Simple item page
dc.contributor.authorPelletier, Robert V.en_US
dc.date.accessioned2013-03-19T19:37:34Z
dc.date.available2013-03-19T19:37:34Z
dc.date.issued1993en_US
dc.degree.disciplineElectrical and Computer Engineeringen_US
dc.degree.levelMaster of Science (M.Sc.)en_US
dc.description.abstracten_US
dc.format.extentxi, 112 leaves :en_US
dc.identifierocm00035423en_US
dc.identifier.urihttp://hdl.handle.net/1993/17771
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleAlternative approaches in improving fault tolerance for a wafer scale environmenten_US
dc.typemaster thesisen_US
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Pelletier_Alternative_approaches.pdf
Size:
7.44 MB
Format:
Adobe Portable Document Format
Description:
Download
Collections
FGS - Electronic Theses and Practica