Fault isolation in linear electronic circuits by utilizing the frequency response and the Moebius transformation
dc.contributor.author | Dyck, John David | en_US |
dc.date.accessioned | 2013-01-28T15:55:34Z | |
dc.date.available | 2013-01-28T15:55:34Z | |
dc.date.issued | 1970 | en_US |
dc.identifier | ocm72765781 | en_US |
dc.identifier.uri | http://hdl.handle.net/1993/15564 | |
dc.description.abstract | en_US | |
dc.format.extent | 90 leaves : | en_US |
dc.language.iso | eng | en_US |
dc.rights | en_US | |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.title | Fault isolation in linear electronic circuits by utilizing the frequency response and the Moebius transformation | en_US |
dc.type | info:eu-repo/semantics/masterThesis | |
dc.type | master thesis | en_US |
dc.degree.discipline | Electrical Engineering | en_US |
dc.degree.level | Master of Science (M.Sc.) | en_US |