Two dimensional delineation of semiconductor doping by scanning conductance microscopy
dc.contributor.author | Shafai, Cyrus | en_US |
dc.date.accessioned | 2012-10-26T19:29:35Z | |
dc.date.available | 2012-10-26T19:29:35Z | |
dc.date.issued | 1993 | en_US |
dc.degree.discipline | Electrical and Computer Engineering | en_US |
dc.degree.level | Master of Science (M.Sc.) | en_US |
dc.description.abstract | en_US | |
dc.format.extent | xii, 133 leaves : | en_US |
dc.identifier | ocm00022861 | en_US |
dc.identifier.uri | http://hdl.handle.net/1993/9686 | |
dc.language.iso | eng | en_US |
dc.rights | open access | en_US |
dc.title | Two dimensional delineation of semiconductor doping by scanning conductance microscopy | en_US |
dc.type | master thesis | en_US |
local.subject.manitoba | yes | en_US |
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