Assessment of soft x-rays for detection of fungal infection in stored wheat

Simple item page
dc.contributor.authorNarvankar, Dipali Shridhar.en_US
dc.date.accessioned2013-05-24T20:55:56Z
dc.date.available2013-05-24T20:55:56Z
dc.date.issued2008en_US
dc.degree.disciplineBiosystems Engineeringen_US
dc.degree.levelMaster of Science (M.Sc.)en_US
dc.description.abstracten_US
dc.format.extent3939564 bytesen_US
dc.identifier(Sirsi) a2001909en_US
dc.identifier.urihttp://hdl.handle.net/1993/21268
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleAssessment of soft x-rays for detection of fungal infection in stored wheaten_US
dc.typemaster thesisen_US
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Narvankar_Assessment_of.pdf
Size:
3.76 MB
Format:
Adobe Portable Document Format
Description:
Download
Collections
FGS - Electronic Theses and Practica