Design and implementation of an automated testbed for evaluating switching behavior of power semiconductors
| dc.contributor.author | Ghosh, Avishek | |
| dc.contributor.examiningcommittee | Kordi, Behzad (Electrical and Computer Engineering), Zhu, Guozhen (Mechanical Engineering) | en_US |
| dc.contributor.supervisor | Ho, Carl (Electrical and Computer Engineering) | en_US |
| dc.date.accessioned | 2019-05-16T20:19:25Z | |
| dc.date.available | 2019-05-16T20:19:25Z | |
| dc.date.issued | 2019-04-04 | en_US |
| dc.date.submitted | 2019-04-04T19:40:35Z | en |
| dc.degree.discipline | Electrical and Computer Engineering | en_US |
| dc.degree.level | Master of Science (M.Sc.) | en_US |
| dc.description.abstract | A Double Pulse Tester (DPT) is a widely used setup for evaluating the switching behavior of power semiconductor devices. The results obtained from double pulse tests provide significant insight into the dynamic behavior of a device under test (DUT) such as its switching losses, switching speed (di/dt, dv/dt), turn-on and turn-off times etc. However, it is a tedious process to perform these tests under different permutations of test parameters and thereafter analyze the experimental data manually. This work presents a newly developed automated DPT prototype, which can run the tests one after another once the test conditions are entered in a Graphic User Interface (GUI). The test-control system also records the switching waveforms, test data, and systematically processes them to generate usable characterization results. The automatic, low cost, compact, modular and user-friendly design allows the proposed testing and measurement system to stand out from the conventional DPT setups. The design principles are experimentally verified by implementing a DPT prototype capable of testing power semiconductor devices up to 1000V, 60A, 250°C. | en_US |
| dc.description.note | May 2019 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1993/33905 | |
| dc.language.iso | eng | en_US |
| dc.rights | open access | en_US |
| dc.subject | Power semiconductor device, Switching characterization, Double pulse test | en_US |
| dc.title | Design and implementation of an automated testbed for evaluating switching behavior of power semiconductors | en_US |
| dc.type | master thesis | en_US |