dc.contributor.author | Rautio, JC | |
dc.contributor.author | Okhmatovski, VI | |
dc.date.accessioned | 2007-10-10T18:25:10Z | |
dc.date.available | 2007-10-10T18:25:10Z | |
dc.date.issued | 2005-09-30 | |
dc.identifier.citation | 0018-9480; IEEE TRANS MICROWAVE THEORY, SEP 2005, vol. 53, no. 9, p.2892 to 2898. | en |
dc.identifier.uri | http://hdl.handle.net/1993/2932 | |
dc.description.abstract | Double-delay and short open calibration (SOC) deembedding are both useful for deembedding the results of a gap voltage source excited electromagnetic analysis. Previously, each approach has been viewed as distinct, each with its own advantages and disadvantages. This paper describes a unifying theory, showing that double delay and SOC are each special cases of an extended SOC technique. Results related to the characteristic impedance as determined by this extended SOC deembedding are also presented. | en |
dc.format.extent | 309675 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.rights | ©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | en |
dc.rights | info:eu-repo/semantics/restrictedAccess | |
dc.subject | calibration | en |
dc.subject | characteristic impedance | en |
dc.subject | deembedding | en |
dc.subject | electromagnetic (EM) analysis | en |
dc.subject | method of moments (MoM) | en |
dc.subject | REVISITING CHARACTERISTIC IMPEDANCE | en |
dc.subject | WAVE CAD MODELS | en |
dc.subject | 3-D MOM SCHEME | en |
dc.subject | PORT DISCONTINUITIES | en |
dc.subject | MULTIPORT CIRCUITS | en |
dc.subject | MICROSTRIP LINE | en |
dc.subject | DEFINITION | en |
dc.subject | MOMENTS | en |
dc.subject | PLANE | en |
dc.title | Unification of double-delay and SOC electromagnetic deembedding | en |
dc.status | Peer reviewed | en |
dc.identifier.doi | http://dx.doi.org/10.1109/TMTT.2005.854250 | |