| dc.contributor.author | Westra, Kenneth L.
|
en_US |
| dc.date.accessioned | 2013-04-08T16:29:48Z | |
| dc.date.available | 2013-04-08T16:29:48Z | |
| dc.date.issued | 1994 | en_US |
| dc.identifier | ocm00122728 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1993/18621 | |
| dc.description.abstract | en_US | |
| dc.format.extent | xiii, 143 leaves : | en_US |
| dc.language | en_US | |
| dc.rights | en_US | |
| dc.title | Atomic force microscopy of thin films | en_US |
| dc.degree.discipline | Electrical and Computer Engineering | en_US |
| View Statistics |
