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dc.contributor.authorCard, Howard Clarence.en_US
dc.date.accessioned2012-12-13T17:01:00Z
dc.date.available2012-12-13T17:01:00Z
dc.date.issued1969en_US
dc.identifierocm72756276en_US
dc.identifier.urihttp://hdl.handle.net/1993/12939
dc.description.abstracten_US
dc.format.extentxiii, 142 leaves :en_US
dc.language.isoengen_US
dc.rightsen_US
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleThe effects of proton radiation on the electronic properties of metal-oxide-semiconductor structuresen_US
dc.typeinfo:eu-repo/semantics/masterThesis
dc.typemaster thesisen_US
dc.degree.disciplineElectrical Engineeringen_US


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