| dc.contributor.author | Card, Howard Clarence.
|
en_US |
| dc.date.accessioned | 2012-12-13T17:01:00Z | |
| dc.date.available | 2012-12-13T17:01:00Z | |
| dc.date.issued | 1969 | en_US |
| dc.identifier | ocm72756276 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1993/12939 | |
| dc.description.abstract | en_US | |
| dc.format.extent | xiii, 142 leaves : | en_US |
| dc.language | en | en_US |
| dc.rights | en_US | |
| dc.title | The effects of proton radiation on the electronic properties of metal-oxide-semiconductor structures | en_US |
| dc.degree.discipline | Electrical Engineering | en_US |
| View Statistics |
