Secondary ion mass spectrometry by time-of-flight

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dc.contributor.authorEns, Erich Werner.en_US
dc.date.accessioned2014-11-24T20:16:52Z
dc.date.available2014-11-24T20:16:52Z
dc.date.issued1984en_US
dc.degree.disciplinePhysicsen_US
dc.degree.levelDoctor of Philosophy (Ph.D.)en_US
dc.description.abstracten_US
dc.format.extentix, 125 [ie.. 129] p. :en_US
dc.identifier99134813590001651en_US
dc.identifier.urihttp://hdl.handle.net/1993/28979
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleSecondary ion mass spectrometry by time-of-flighten_US
dc.typedoctoral thesisen_US
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