ULTRASONIC SIMULATION AND MEASUREMENTS WITH CUT-OFF FREQUENCY EXTRACTIONS
| dc.contributor.author | ADEOGUN, KAZEEM | |
| dc.contributor.examiningcommittee | Birouk, Madjid (MECHANICAL ENGINEERING) Shalaby, Ahmed (CIVIL ENGINEERING) | en_US |
| dc.contributor.supervisor | Popplewell, Neil (MECHANICAL ENGINEERING) Bai, Hao (MECHANICAL ENGINEERING) | en_US |
| dc.date.accessioned | 2013-01-04T15:39:23Z | |
| dc.date.available | 2013-01-04T15:39:23Z | |
| dc.date.issued | 2013-01-04 | |
| dc.degree.discipline | Mechanical and Manufacturing Engineering | en_US |
| dc.degree.level | Master of Science (M.Sc.) | en_US |
| dc.description.abstract | The removal of the effect of imperfect dynamic properties of ultrasonic transducers and associated electronics, as well as the couplant to a structure, from experimental data is presented. The investigation reveals that it is unnecessary for the instrumentation to have an ideal frequency response function for a transducer because imperfect measurement behaviour can be removed with post processing. A computer simulation of a homogeneous, isotropic pipe’s radial displacement is shown to agree closely with a corresponding measurement if a reasonably accurate frequency response function of the measurement chain is incorporated. A procedure to extract the cut-off frequencies of an unblemished pipe and the singularity frequencies of a notched pipe is developed. Frequency differences between the cut-off frequencies and the nearest frequencies of singularities introduced by a circumferential notch are investigated. It is confirmed experimentally that singularities are introduced by a notch and differences are measurable at a 95% confidence level. | en_US |
| dc.description.note | February 2013 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1993/14398 | |
| dc.language.iso | eng | en_US |
| dc.rights | open access | en_US |
| dc.subject | ULTRASONIC | en_US |
| dc.title | ULTRASONIC SIMULATION AND MEASUREMENTS WITH CUT-OFF FREQUENCY EXTRACTIONS | en_US |
| dc.type | master thesis | en_US |