Electronic properties of grain boundaries in silicon

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dc.contributor.authorThomson, Douglas J.en_US
dc.date.accessioned2013-01-18T21:33:56Z
dc.date.available2013-01-18T21:33:56Z
dc.date.issued1983en_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.levelMaster of Science (M.Sc.)en_US
dc.description.abstracten_US
dc.format.extentx, 107 leaves :en_US
dc.identifierocm72806995en_US
dc.identifier.urihttp://hdl.handle.net/1993/15158
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleElectronic properties of grain boundaries in siliconen_US
dc.typemaster thesisen_US
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