Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy

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dc.contributor.authorWeng, Terry (Zhinong)en_US
dc.date.accessioned2013-05-17T18:11:29Z
dc.date.available2013-05-17T18:11:29Z
dc.date.issued2005en_US
dc.degree.disciplineElectrical and Computer Engineeringen_US
dc.degree.levelDoctor of Philosophy (Ph.D.)en_US
dc.description.abstracten_US
dc.format.extentxviii, 157 leaves :en_US
dc.identifier(Sirsi) a1630101en_US
dc.identifier.urihttp://hdl.handle.net/1993/20826
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleInternal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopyen_US
dc.typedoctoral thesisen_US
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