External field coupling to MTL networks with nonlinear junctions: Numerical modeling and experimental validation
dc.contributor.author | Lapohos, T | |
dc.contributor.author | LoVetri, J | |
dc.contributor.author | Seregelyi, J | |
dc.date.accessioned | 2007-10-30T14:28:04Z | |
dc.date.available | 2007-10-30T14:28:04Z | |
dc.date.issued | 2000-02-29 | |
dc.description.abstract | The problem of predicting the voltages and currents induced on a printed circuit multiconductor transmission line (MTL) network by an impinging transient plane wave electromagnetic field is considered, The MTL network contains nonlinear circuit elements and test cases with various dielectric substrates are examined, Numerical predictions based on quasi-TEM models of the MTL's and modified nodal analysis (MNA) models of the lumped element junctions are compared to experimental results obtained in the time domain using a GTEM cell. As has been done in the past, the effect of the incident plane wave is introduced as forcing functions in the MTL equations, The primary goal of this paper is to quantify the accuracy of the various commonly used quasi-TEM mathematical time-domain models. It is shown that when modeling the forcing function terms, it is important to take into account the perturbation of the incident plane wave due to the dielectric substrate, (The experimental-numerical comparisons herein are shown for the case of end-fire illumination since it best demonstrates this point.) Neglecting the dielectric effect on the incident transient pulse, even for substrates with low dielectric constant, produces poor results. | en |
dc.format.extent | 555840 bytes | |
dc.format.mimetype | application/pdf | |
dc.identifier.citation | 0018-9375; IEEE TRANS ELECTROMAGN COMPAT, FEB 2000, vol. 42, no. 1, p.16 to 28. | en |
dc.identifier.doi | http://dx.doi.org/10.1109/15.831701 | |
dc.identifier.uri | http://hdl.handle.net/1993/2955 | |
dc.language.iso | eng | en_US |
dc.rights | ©2000 IEEE. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Manitoba's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. | en |
dc.rights | restricted access | en_US |
dc.status | Peer reviewed | en |
dc.subject | experimental validation | en |
dc.subject | field coupling | en |
dc.subject | measurements | en |
dc.subject | modified nodal analysis | en |
dc.subject | modeling | en |
dc.subject | MNA | en |
dc.subject | MTL | en |
dc.subject | MTL network | en |
dc.subject | nonlinear circuits | en |
dc.subject | printed circuit board | en |
dc.subject | surface wave | en |
dc.subject | transient | en |
dc.subject | ELECTROMAGNETIC-FIELD | en |
dc.subject | FORMULATION | en |
dc.subject | CROSSTALK | en |
dc.subject | SPICE | en |
dc.subject | LINES | en |
dc.title | External field coupling to MTL networks with nonlinear junctions: Numerical modeling and experimental validation | en |