Microwave test chamber for measuring the relative permittivity of thin films

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dc.contributor.authorAhluwalia, Harinder Pal Singhen_US
dc.date.accessioned2013-01-28T15:54:52Z
dc.date.available2013-01-28T15:54:52Z
dc.date.issued1970en_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.levelMaster of Science (M.Sc.)en_US
dc.description.abstracten_US
dc.format.extent43 leaves :en_US
dc.identifierocm72729239en_US
dc.identifier.urihttp://hdl.handle.net/1993/15507
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleMicrowave test chamber for measuring the relative permittivity of thin filmsen_US
dc.typemaster thesisen_US
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