Microwave test chamber for measuring the relative permittivity of thin films
dc.contributor.author | Ahluwalia, Harinder Pal Singh | en_US |
dc.date.accessioned | 2013-01-28T15:54:52Z | |
dc.date.available | 2013-01-28T15:54:52Z | |
dc.date.issued | 1970 | en_US |
dc.degree.discipline | Electrical Engineering | en_US |
dc.degree.level | Master of Science (M.Sc.) | en_US |
dc.description.abstract | en_US | |
dc.format.extent | 43 leaves : | en_US |
dc.identifier | ocm72729239 | en_US |
dc.identifier.uri | http://hdl.handle.net/1993/15507 | |
dc.language.iso | eng | en_US |
dc.rights | open access | en_US |
dc.title | Microwave test chamber for measuring the relative permittivity of thin films | en_US |
dc.type | master thesis | en_US |
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