The effects of temperature and radiation on current instabilities caused by recombination centers in semiconductors
dc.contributor.author | Elsharkawi, Abdelrahman R. | en_US |
dc.date.accessioned | 2013-01-30T19:48:01Z | |
dc.date.available | 2013-01-30T19:48:01Z | |
dc.date.issued | 1971 | en_US |
dc.degree.discipline | Electrical Engineering | en_US |
dc.degree.level | Master of Science (M.Sc.) | en_US |
dc.description.abstract | en_US | |
dc.format.extent | viii, 81 p. | en_US |
dc.identifier | ocm72767317 | en_US |
dc.identifier.uri | http://hdl.handle.net/1993/15913 | |
dc.language.iso | eng | en_US |
dc.rights | open access | en_US |
dc.title | The effects of temperature and radiation on current instabilities caused by recombination centers in semiconductors | en_US |
dc.type | master thesis | en_US |
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