Electrical impedance computed tomography : algorithms and systems

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dc.contributor.authorMu, Zhenen_US
dc.date.accessioned2013-03-28T14:23:22Z
dc.date.available2013-03-28T14:23:22Z
dc.date.issued1994en_US
dc.degree.disciplineElectrical and Computer Engineeringen_US
dc.degree.levelDoctor of Philosophy (Ph.D.)en_US
dc.description.abstracten_US
dc.format.extent[xii], 135 leaves :en_US
dc.identifierocm00127719en_US
dc.identifier.urihttp://hdl.handle.net/1993/18210
dc.language.isoengen_US
dc.rightsopen accessen_US
dc.titleElectrical impedance computed tomography : algorithms and systemsen_US
dc.typedoctoral thesisen_US
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