Soft X-ray inspection of wheat kernels to detect infestations by stored-grain insects
dc.contributor.author | Karunakaran, Chithra | en_US |
dc.date.accessioned | 2013-04-25T14:50:21Z | |
dc.date.available | 2013-04-25T14:50:21Z | |
dc.date.issued | 2002 | en_US |
dc.identifier | (Sirsi) APL-5517 | en_US |
dc.identifier.uri | http://hdl.handle.net/1993/19676 | |
dc.description.abstract | en_US | |
dc.format.extent | 2 v. (xx, 483 leaves) : | en_US |
dc.language.iso | eng | en_US |
dc.rights | en_US | |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.title | Soft X-ray inspection of wheat kernels to detect infestations by stored-grain insects | en_US |
dc.type | info:eu-repo/semantics/doctoralThesis | |
dc.type | doctoral thesis | en_US |
dc.degree.discipline | Biosystems Engineering | en_US |
dc.degree.level | Doctor of Philosophy (Ph.D.) | en_US |