Show simple item record

Soft X-ray inspection of wheat kernels to detect infestations by stored-grain insects

dc.contributor.authorKarunakaran, Chithraen_US
dc.date.accessioned2013-04-25T14:50:21Z
dc.date.available2013-04-25T14:50:21Z
dc.date.issued2002en_US
dc.identifier(Sirsi) APL-5517en_US
dc.identifier.urihttp://hdl.handle.net/1993/19676
dc.description.abstracten_US
dc.format.extent2 v. (xx, 483 leaves) :en_US
dc.language.isoengen_US
dc.rightsen_US
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleSoft X-ray inspection of wheat kernels to detect infestations by stored-grain insectsen_US
dc.typeinfo:eu-repo/semantics/doctoralThesis
dc.typedoctoral thesisen_US
dc.degree.disciplineBiosystems Engineeringen_US
dc.degree.levelDoctor of Philosophy (Ph.D.)en_US


Files in this item

Thumbnail
Name:
Karunakaran_Soft_X-ray_V2.pdf
Size:
8.914Mb
Format:
PDF
View/Open

This item appears in the following Collection(s)

Show simple item record