Analysis of a microwave void fraction monitor
dc.contributor.author | Boyachok, John Harry | en_US |
dc.date.accessioned | 2012-12-14T17:49:23Z | |
dc.date.available | 2012-12-14T17:49:23Z | |
dc.date.issued | 1974 | en_US |
dc.identifier | ocm72752138 | en_US |
dc.identifier.uri | http://hdl.handle.net/1993/13350 | |
dc.description.abstract | en_US | |
dc.format.extent | iv, 53 leaves : | en_US |
dc.language.iso | eng | en_US |
dc.rights | en_US | |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.title | Analysis of a microwave void fraction monitor | en_US |
dc.type | info:eu-repo/semantics/masterThesis | |
dc.type | master thesis | en_US |
dc.degree.discipline | Electrical Engineering | en_US |
dc.degree.level | Master of Science (M.Sc.) | en_US |