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Analysis of a microwave void fraction monitor

dc.contributor.authorBoyachok, John Harryen_US
dc.date.accessioned2012-12-14T17:49:23Z
dc.date.available2012-12-14T17:49:23Z
dc.date.issued1974en_US
dc.identifierocm72752138en_US
dc.identifier.urihttp://hdl.handle.net/1993/13350
dc.description.abstracten_US
dc.format.extentiv, 53 leaves :en_US
dc.language.isoengen_US
dc.rightsen_US
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleAnalysis of a microwave void fraction monitoren_US
dc.typeinfo:eu-repo/semantics/masterThesis
dc.typemaster thesisen_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.levelMaster of Science (M.Sc.)en_US


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