| dc.contributor.author | Boyachok, John Harry
|
en_US |
| dc.date.accessioned | 2012-12-14T17:49:23Z | |
| dc.date.available | 2012-12-14T17:49:23Z | |
| dc.date.issued | 1974 | en_US |
| dc.identifier | ocm72752138 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1993/13350 | |
| dc.description.abstract | en_US | |
| dc.format.extent | iv, 53 leaves : | en_US |
| dc.language | en | en_US |
| dc.rights | en_US | |
| dc.rights | info:eu-repo/semantics/openAccess | |
| dc.title | Analysis of a microwave void fraction monitor | en_US |
| dc.type | info:eu-repo/semantics/masterThesis | |
| dc.type | master thesis | en_US |
| dc.degree.discipline | Electrical Engineering | en_US |
| View Statistics |
