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dc.contributor.author Boyachok, John Harry en_US
dc.date.accessioned 2012-12-14T17:49:23Z
dc.date.available 2012-12-14T17:49:23Z
dc.date.issued 1974 en_US
dc.identifier ocm72752138 en_US
dc.identifier.uri http://hdl.handle.net/1993/13350
dc.description.abstract en_US
dc.format.extent iv, 53 leaves : en_US
dc.language en en_US
dc.rights en_US
dc.rights info:eu-repo/semantics/openAccess
dc.title Analysis of a microwave void fraction monitor en_US
dc.type info:eu-repo/semantics/masterThesis
dc.degree.discipline Electrical Engineering en_US


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