Statistics for Characterization of electronically active defects in hafnium dioxide high-[kappa] gate dielectrics

Total visits

views
Characterization of electronically active defects in hafnium dioxide high-[kappa] gate dielectrics 197

Total visits per month

views
November 2023 0
December 2023 1
January 2024 0
February 2024 0
March 2024 0
April 2024 0
May 2024 0

File Visits

views
Felnhofer_Characterization_of.pdf 349

Top country views

views
United States 59
Germany 36
Canada 23
China 21
Ireland 11
Finland 5
United Kingdom 4
Cyprus 2
France 2
Sweden 2
Vietnam 2
Brazil 1
Hong Kong SAR China 1
South Korea 1
Malaysia 1
Singapore 1
Taiwan 1

Top city views

views
Winnipeg 23
Ashburn 20
Dublin 10
Inglewood 8
Palo Alto 8
Beijing 6
Mountain View 5
Zhengzhou 5
Boardman 3
Helsinki 3
Brooklyn 2
Burton-on-Trent 2
Hanoi 2
Landshut 2
Offenburg 2
Shanghai 2
Tianjin 2
Berlin 1
Brasília 1
Central 1
Changzhou 1
Chongqing 1
Columbus 1
Des Moines 1
Frankfurt am Main 1
Heidelberg 1
Los Angeles 1
Mannheim 1
Morlenbach 1
Mudau 1
Nagold 1
Namdong-gu 1
Schwann 1
Seattle 1
Shah Alam 1
Singapore 1
Taichung 1