Show simple item record Pelletier, Robert V. en_US 2013-03-19T19:37:34Z 2013-03-19T19:37:34Z 1993 en_US
dc.identifier ocm00035423 en_US
dc.description.abstract en_US
dc.format.extent xi, 112 leaves : en_US
dc.language en_US
dc.rights en_US
dc.rights info:eu-repo/semantics/openAccess
dc.title Alternative approaches in improving fault tolerance for a wafer scale environment en_US
dc.type info:eu-repo/semantics/masterThesis
dc.type master thesis en_US Electrical and Computer Engineering en_US

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