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Please use this identifier to cite or link to this item: http://hdl.handle.net/1993/2932

Title: Unification of double-delay and SOC electromagnetic deembedding
Authors: Rautio, JC
Okhmatovski, VI
Keywords: calibration
characteristic impedance
deembedding
electromagnetic (EM) analysis
method of moments (MoM)
REVISITING CHARACTERISTIC IMPEDANCE
WAVE CAD MODELS
3-D MOM SCHEME
PORT DISCONTINUITIES
MULTIPORT CIRCUITS
MICROSTRIP LINE
DEFINITION
MOMENTS
PLANE
Issue Date: 30-Sep-2005
Citation: 0018-9480; IEEE TRANS MICROWAVE THEORY, SEP 2005, vol. 53, no. 9, p.2892 to 2898.
Abstract: Double-delay and short open calibration (SOC) deembedding are both useful for deembedding the results of a gap voltage source excited electromagnetic analysis. Previously, each approach has been viewed as distinct, each with its own advantages and disadvantages. This paper describes a unifying theory, showing that double delay and SOC are each special cases of an extended SOC technique. Results related to the characteristic impedance as determined by this extended SOC deembedding are also presented.
URI: http://hdl.handle.net/1993/2932
DOI: http://dx.doi.org/10.1109/TMTT.2005.854250
Appears in Collection(s):Research Publications (UofM Student, Faculty and Staff only access)

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