Unification of double-delay and SOC electromagnetic deembedding
Date
2005-09-30
Authors
Rautio, JC
Okhmatovski, VI
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Abstract
Double-delay and short open calibration (SOC) deembedding are both useful for deembedding the results of a gap voltage source excited electromagnetic analysis. Previously, each approach has been viewed as distinct, each with its own advantages and disadvantages. This paper describes a unifying theory, showing that double delay and SOC are each special cases of an extended SOC technique. Results related to the characteristic impedance as determined by this extended SOC deembedding are also presented.
Description
Keywords
calibration, characteristic impedance, deembedding, electromagnetic (EM) analysis, method of moments (MoM), REVISITING CHARACTERISTIC IMPEDANCE, WAVE CAD MODELS, 3-D MOM SCHEME, PORT DISCONTINUITIES, MULTIPORT CIRCUITS, MICROSTRIP LINE, DEFINITION, MOMENTS, PLANE
Citation
0018-9480; IEEE TRANS MICROWAVE THEORY, SEP 2005, vol. 53, no. 9, p.2892 to 2898.